Neural Comp. Sign up for ETOCS
HOME HELP FEEDBACK SUBSCRIPTIONS ARCHIVE SEARCH TABLE OF CONTENTS
 QUICK SEARCH:   [advanced]


     


This Article
Right arrow Full Text (PDF)
Right arrow Alert me when this article is cited
Right arrow Alert me if a correction is posted
Services
Right arrow Similar articles in this journal
Right arrow Similar articles in PubMed
Right arrow Alert me to new issues of the journal
Right arrow Download to citation manager
Right arrow reprints & permissions
Citing Articles
Right arrow Citing Articles via Google Scholar
Google Scholar
Right arrow Articles by Riesenhuber, M.
Right arrow Articles by Geisel, T.
Right arrow Search for Related Content
PubMed
Right arrow PubMed Citation
Right arrow Articles by Riesenhuber, M.
Right arrow Articles by Geisel, T.

Neural Computation, Vol 10, 717-730, Copyright © 1998 by The MIT Press


LETTERS

Breaking Rotational Symmetry in a Self-Organizing Map-Model for Orientation Map Development

M. Riesenhuber, H. U. Bauer, D. Brockmann and T. Geisel

We analyze the pattern formation behavior of a high-dimensional self-organizing map (SOM) model for the competitive projection of ON-center-type and OFF-center-type inputs to a common map layer. We mathematically show, and numerically confirm, that even isotropic stimuli can drive the development of oriented receptive fields and an orientation map in this model. This result provides an important missing link in the spectrum of pattern formation behaviors observed in SOM models. Extending the model by including further layers for binocular inputs, we also investigate the combined development of orientation and ocular dominance maps. A parameter region for combined patterns exists; corresponding maps show a preference for perpendicular intersection angles between iso-orientation lines and ocularity domain boundaries, consistent with experimental observations.





HOME HELP FEEDBACK SUBSCRIPTIONS ARCHIVE SEARCH TABLE OF CONTENTS
J COGNITIVE NEUROSCIENCE NEURAL COMPUTATION MIT PRESS JOURNALS
Copyright © 1998 by The MIT Press.